Yield Values

• P for 2-metal CMOS is about 2
• P for 4-metal CMOS is about 3
• P for 6-metal CMOS is about 4
• Defects/sq. cm. is about 0.4 to 0.8
  • Down by about 0.4 in 5 years
• Yields range from 20% to 90% depending on chip size
• Typical would be 50% for 1 sq. cm.

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